IEC 60749-5 Ed. 3.0 b:2023
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
International Electrotechnical Commission , 12/01/2023
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This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.
Product Information
Published:
12/01/2023
Pages:
22
ISBN:
9782832280331
File Size:
1 file , 720 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-5 Ed. 3.0 b:2023
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