IEC 60749-5 Ed. 2.0 en:2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
International Electrotechnical Commission , 04/10/2017
$26.00
$51.00
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.
Product Information
Published:
04/10/2017
Pages:
9
File Size:
1 file , 260 KB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-5 Ed. 3.0 b:2023
$26.00
IEC 60749-5 Ed. 2.0 b:2017
$26.00
IEC 60749-5 Ed. 2.0 en:2017
$26.00
Related Documents
IEC 60947-4-1 Ed. 3.1 b:2012
$381.00
IEC 60794-2-50 Ed. 1.0 b:2008
$118.00
IEC 61286 Ed. 2.0 b:2001
$37.00
IEC 60050-195 Ed. 1.0 b:1998
$155.00