IPC 9261:2002

In-Process DPMO and Estimated Yield for PWAs

Association Connecting Electronics Industries , 03/01/2002

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This document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912. A guide to defect categorization is provided that can serve as a base for summarizing and reporting in-process defects when used with J-STD-001 and IPC-A-610. It can also be used to develop process step estimated yield - the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates.

Product Information

Published: 03/01/2002
Pages: 24
File Size: 1 file , 170 KB
Language: English
Note: This product is unavailable in Russia, Ukraine, Belarus
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