IEEE 1671.1-2017

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

IEEE , 03/19/2018

$104.00 $207.00

IEEE 1671.1-2017 PDF

This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the life cycle of test program sets (TPSs) that will be used in an automatic test environment. No purpose statement is required since this standard is intended for IEC standardization Revision Standard - Active. An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.

Product Information

Published: 03/19/2018
Pages: 274
ISBN: 9781504446327, 9781504446310, 9781504447874
File Size: 1 file , 4.7 MB
Language: English
Note: This product is unavailable in Russia, Ukraine, Belarus
IEEE 1671.1-2017
IEEE 1671.1-2009

Related Documents

IEEE 1621-2004
IEEE 690-2018
IEEE 690-2018

$29.00

IEEE PC135.100
IEEE P2984:2025