IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

IEEE , 01/27/2017

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IEEE 1445-2016 PDF

This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE). This standard is to be used as the standard definition of DATPG output formats and informational content. Revision Standard - Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

Product Information

Published: 01/27/2017
Pages: 64
ISBN: 9781504436915, 9781504436922, 9781504437776
File Size: 1 file , 1 MB
Language: English
Note: This product is unavailable in Russia, Ukraine, Belarus
IEEE 1445-2016
IEEE 1445-1998

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