IEC 62884-2 Ed. 1.0 en:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
International Electrotechnical Commission , 08/30/2017
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IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE - Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE - Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
Product Information
Published:
08/30/2017
Pages:
24
File Size:
1 file , 650 KB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
IEC 62884-2 Ed. 1.0 b:2017
$95.00
IEC 62884-2 Ed. 1.0 en:2017
$95.00
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