Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
Product Information
Published:
04/30/2002
Pages:
57
File Size:
2 files , 2.8 MB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus