Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
Product Information
Published:
04/27/2005
Pages:
51
File Size:
1 file , 1000 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus