IEC 61189-5-503 Ed. 1.0 en:2017
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
International Electrotechnical Commission , 05/22/2017
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IEC 61189-5-503:2017(E) specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
Product Information
Published:
05/22/2017
Pages:
23
File Size:
1 file , 680 KB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
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