IEC 61164 Ed. 2.0 en:2004
Reliability growth - Statistical test and estimation methods
International Electrotechnical Commission , 03/24/2004
$122.00
$243.00
Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.
Product Information
Published:
03/24/2004
Pages:
55
File Size:
1 file , 780 KB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
IEC 61164 Ed. 2.0 en:2004
$122.00
IEC 61164 Ed. 2.0 b:2004
$184.00
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