IEC 61163-1 Ed. 1.0 b:1995

Reliability stress screening - Part 1: Repairable items manufactured in lots

International Electrotechnical Commission , 08/14/1995

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These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

Product Information

Published: 08/14/1995
Pages: 153
File Size: 1 file , 5.8 MB
Language: English, French
Note: This product is unavailable in Ukraine, Russia, Belarus
IEC 61163-1 Ed. 2.0 b:2006
IEC 61163-1 Ed. 1.0 b:1995

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