IEC 60749-7 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
International Electrotechnical Commission , 04/09/2002
$21.00
$42.00
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
Product Information
Published:
04/09/2002
Pages:
15
File Size:
1 file , 430 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-7 Ed. 2.0 b:2011
$26.00
IEC 60749-7 Ed. 1.0 b:2002
$21.00
Related Documents
IEC 62020 Ed. 1.1 b:2003
$323.00
