IEC 60749-4 Ed. 2.0 b:2017
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
International Electrotechnical Commission , 03/03/2017
$26.00
$51.00
IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition:
a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
c) allowance of additional time-to-test delay or return-to-stress delay.
a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
c) allowance of additional time-to-test delay or return-to-stress delay.
Product Information
Published:
03/03/2017
Pages:
20
File Size:
1 file , 1.1 MB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-4 Ed. 2.0 b:2017
$26.00
IEC 60749-4 Ed. 2.0 en:2017
$26.00
Related Documents
IEC 62769-100 Ed. 1.0 b:2020
$139.00
IEC 61591 Ed. 1.1 b:2005
$62.00
