IEC 60749-33 Ed. 1.0 b:2004

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

International Electrotechnical Commission , 03/09/2004

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The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

Product Information

Published: 03/09/2004
Pages: 17
File Size: 1 file , 450 KB
Language: English, French
Note: This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-33 Ed. 1.0 b:2005
IEC 60749-33 Ed. 1.0 b:2004

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