IEC 60749-29 Ed. 1.0 b:2003
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
International Electrotechnical Commission , 11/04/2003
$55.00
$110.00
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to latch-up.
Product Information
Published:
11/04/2003
Pages:
41
File Size:
1 file , 920 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-29 Ed. 2.0 b:2011
$95.00
IEC 60749-29 Ed. 1.0 b:2003
$55.00
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