IEC 60749-26 Ed. 2.0 b:2006
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
International Electrotechnical Commission , 07/18/2006
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Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.
Product Information
Published:
07/18/2006
Pages:
27
File Size:
1 file , 520 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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IEC 60749-26 Ed. 3.0 b:2013
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IEC 60749-26 Ed. 2.0 b:2006
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IEC 60749-26 Ed. 1.0 b:2003
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