IEC 60749-20 Ed. 3.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

International Electrotechnical Commission , 08/01/2020

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This part of IEC 60749 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive.

Product Information

Published: 08/01/2020
Pages: 60
ISBN: 9782832287279
File Size: 1 file , 2.5 MB
Language: English, French
Note: This product is unavailable in Ukraine, Russia, Belarus
IEC 60749-20 Ed. 3.0 b:2020
IEC 60749-20 Ed. 2.0 b:2008

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