BS PD ISO/TR 19319:2003

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

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Cross References:ISO 18115:2001ISO 9334:1995ISO 9335:1995 ASTM E 1217-00

Published: 04/05/2005

Pages: 26

ISBN: 0580457141

File Size: 1 file , 590 KB

Language: English

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$132.00