TIA ANSI/TIA/EIA-455-132A

This document defines three methods of measuring A_eff. Information common to all themethods is found in the body of this document. Information specific to each method isfound in a normative annex. The three methods are:

A Direct far-field (DFF)

B Variable aperture in the far-field (VAMFF)

C Near-field (NF)

The reference method, used to resolve disputes, is Method A, direct far-field.