IEEE 1545-1999

IEEE Standard for Parametric Data Log Format

IEEE , 11/15/1999

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This standard will define the file and record formats for parametric test data acquired during a test operation. This standard supports and is part of the IEEE 1226 family of standards. The purpose of this standard is to provide a means to log parametric data so that the data can be exchanged for the purpose of analysis and historical trend reporting. New IEEE Standard - Inactive-Withdrawn. Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.

Product Information

Published: 11/15/1999
Pages: 36
ISBN: 0738117757, 9780738117768
File Size: 1 file , 100 KB
Language: English
Note: This product is unavailable in Russia, Belarus

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