IEC 63287-2 Ed. 1.0 b:2023
Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of mission profile
International Electrotechnical Commission , 03/01/2023
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This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
Product Information
Published:
03/01/2023
Pages:
34
ISBN:
9782832267080
File Size:
1 file , 930 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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