IEC 63287-1 Ed. 1.0 b:2021
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
International Electrotechnical Commission , 08/01/2021
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This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.
NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.
NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
Product Information
Published:
08/01/2021
Pages:
90
ISBN:
9782832210172
File Size:
1 file , 2.7 MB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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