IEC 63202-1 Ed. 1.0 b:2019

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

International Electrotechnical Commission , 06/20/2019

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IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.

Product Information

Published: 06/20/2019
Pages: 17
File Size: 1 file , 1.1 MB
Language: English, French
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