IEC 62951-6 Ed. 1.0 b:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
International Electrotechnical Commission , 05/06/2019
$95.00
$190.00
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
Product Information
Published:
05/06/2019
Pages:
50
File Size:
1 file , 1.9 MB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
Related Documents
IEC 63068-4 Ed. 1.0 en:2022
$95.00
