IEC 62899-402-1 Ed. 1.0 en:2017

Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

International Electrotechnical Commission , 03/03/2017

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IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

Product Information

Published: 03/03/2017
Pages: 12
File Size: 1 file , 380 KB
Language: English
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