IEC 62415 Ed. 1.0 b:2010
Semiconductor devices - Constant current electromigration test
International Electrotechnical Commission , 05/19/2010
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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Product Information
Published:
05/19/2010
Pages:
22
File Size:
1 file , 910 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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