IEC 62415 Ed. 1.0 b:2010
Semiconductor devices - Constant current electromigration test
International Electrotechnical Commission , 05/19/2010
$26.00
$51.00
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Product Information
Published:
05/19/2010
Pages:
22
File Size:
1 file , 910 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
Related Documents
IEC 61051-2 Ed. 2.0 b:2021
$95.00
IEC 60317-33 Ed. 2.0 en:2015
$26.00
IEC 61850-6 Amd.2 Ed. 2.0 b:2024
$242.00