IEC 62374 Ed. 1.0 b:2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
International Electrotechnical Commission , 03/29/2007
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$190.00
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
Product Information
Published:
03/29/2007
Pages:
43
File Size:
1 file , 720 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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