IEC 62373 Ed. 1.0 b:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
International Electrotechnical Commission , 07/18/2006
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$95.00
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Product Information
Published:
07/18/2006
Pages:
27
File Size:
1 file , 530 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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