IEC 62047-40 Ed. 1.0 en:2021
Semiconductor devices - Micro-electromechanical devices - Part 40: Test methods of micro-electromechanical inertial shock switch threshold
International Electrotechnical Commission , 09/01/2021
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This part of IEC 62047 specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open microelectromechanical inertial shock switch.
Product Information
Published:
09/01/2021
Pages:
16
ISBN:
9782832210187
File Size:
1 file , 1.2 MB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
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