IEC 61967-6 Ed. 1.0 b:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
International Electrotechnical Commission , 06/25/2002
$64.00
$128.00
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.
Product Information
Published:
06/25/2002
Pages:
51
File Size:
1 file , 750 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
Related Documents
IEC 60318-7 Ed. 1.0 b:2022
$139.00
IEC 60060-SER Ed. 1.0 b:2023
$460.00
IEC 61784-3-12 Ed. 1.1 b:2019
$291.00
