IEC 61445 Ed. 1.0 en:2012
Digital Test Interchange Format (DTIF)
International Electrotechnical Commission , 06/21/2012
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IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
Product Information
Published:
06/21/2012
Pages:
101
File Size:
1 file , 1.8 MB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
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