Defines functional levels, standard test methods and gauges for use in the examination of sockets designed for in-line electronic packages. Lays down appropriate reference dimensions of the mating device and board layout to establish intermateability and interchangeability criteria. Lays down test severity and performance requirements.
Product Information
Published:
03/22/2001
Pages:
61
File Size:
1 file , 470 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus