IEC 60749-8 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
International Electrotechnical Commission , 08/30/2002
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Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.
Product Information
Published:
08/30/2002
Pages:
31
File Size:
1 file , 560 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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