IEC 60749-43 Ed. 1.0 b:2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
International Electrotechnical Commission , 06/15/2017
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IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Product Information
Published:
06/15/2017
Pages:
74
File Size:
1 file , 1.1 MB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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