IEC 60749-17 Ed. 2.0 b:2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
International Electrotechnical Commission , 03/28/2019
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IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Product Information
Published:
03/28/2019
Pages:
17
File Size:
1 file , 1000 KB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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