IEC 60748-11-1 Ed. 1.0 b:1992
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
International Electrotechnical Commission , 04/01/1992
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The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
Product Information
Published:
04/01/1992
Pages:
71
File Size:
1 file , 2.5 MB
Language:
English, French
Note:
This product is unavailable in Ukraine, Russia, Belarus
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