IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
Product Information
Published:
05/20/2019
Pages:
26
File Size:
1 file , 2.3 MB
Language:
English
Note:
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