It provides a measurement method for the determination of the chiral indices of the semi-conductingSWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTsin a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.Cross References:ISO/TS 80004-4ISO/TS 80004-6