BS PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions. Near-field scan data exchange format

BSI Group , 09/30/2015

$184.00 $368.30
BS PD IEC/TR 61967-1-1:2015 provides guidance for exchanging data generated by near-field scanmeasurements.The described exchange format could also be used for near-field scan data generated bysimulation or computation software. It should be noted that, although it has been developedfor near-field scan, its use is not restricted to this application. The exchange format can beapplied to emission and immunity near-field scan data in the frequency and time domains.The scope of this technical report includes neither the methods used for the measurements orsimulations, nor the software and algorithms used for generating the exchange file or forprocessing or viewing the data contained therein.Cross References:IEC 60050IEC 61967-1ISO 8879ANSI INCITS 4:1986IEEE Std 754-2008IEC TS 61967-3IEC TS 62132-9IEC 60050-131IEC 60050-161IEC 62132-1

Product Information

Published: 09/30/2015
Pages: 68
ISBN: 9780580862045
File Size: 1 file , 1.6 MB
Language: English
Note: This product is unavailable in Ukraine, Russia, Belarus

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