BS PD IEC TR 61189-5-506:2019
Test methods for electrical materials, printed boards and other interconnection structures and assemblies-General test methods for materials and assemblies. An intercomparison evaluation to implement the use of fine-pitch test structures for surface insulation resistance (SIR) testing of solder fluxes in accordance with IEC 61189-5-501
BSI Group , 07/18/2019
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This Technical Report is an intercomparison supporting the development of IEC 61189-5-501 in relation to the SIR method. This document sets out to validate the introduction of a new 200-µm gap SIR pattern, and was benched marked against existing SIR gap patterns of 318 µm and 500 µm.Cross References:IEC 60068-2-20:2008IEC 61189-5-501
Product Information
Published:
07/18/2019
Pages:
26
ISBN:
9780539000689
File Size:
1 file , 5.1 MB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
