Specifies requirements for the data needed to describe the test and quality parameters of semiconductor die and gives recommendations for general industry good practice. To be read in conjunction with PD ES 59008-1:2000,PD ES 59008-3:1999Cross References:ES 59008-1:1999ES 59008-2:1999ES 59008-3:1999ES 59008-6-1:1999ES 59008-6-2IEC 61360:1995
Product Information
Published:
03/15/2001
Pages:
14
ISBN:
0580369722
File Size:
1 file , 190 KB
Language:
English
Note:
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