BS PD CEN/TR 16978:2016 describes the methodology used for the survey on Isolated Defects (ID) and givesthe results.Cross References:EN 13848-1EN 13848-5:2008+A1:2010EN 13848
Product Information
Published:
10/31/2016
Pages:
58
ISBN:
9780580872341
File Size:
1 file , 6.7 MB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus