Methods of test and inspection procedures.Cross References:BS 308:Part 2BS 308:Part 3BS 2011:Part 1.1 BS 4500:Part 1BS 5555BS 5772:Part 1BS 5772:Part 2BS 5772:Part 3BS 6001BS 9000:Part 2BS E9007BS CECC 00009IEC 27 IEC 50(581)Partially replaced by BS EN 175100:1993.Incorporates the following:AMD 7806 published 15 June 1993
Product Information
Published:
11/30/1984
Pages:
34
ISBN:
058014111X
File Size:
1 file , 610 KB
Language:
English
Note:
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