BS CECC 00013:1985
Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
BSI Group , 08/30/1985
$132.00
$264.16
Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.
Product Information
Published:
08/30/1985
Pages:
24
ISBN:
0580146022
File Size:
1 file , 820 KB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
