ATIS T1.TR.48-1996
Test Patterns for DS0 and Synchronous Digital Data Circuits
The Alliance for Telecommunications Industry Solutions , 06/01/1996
$30.00
$60.00
This report documents the various test patterns used to qualify and troubleshoot both DS0 and Synchronous Digital Data Circuits.
Product Information
Published:
06/01/1996
File Size:
1 file , 34 KB
Language:
English
Note:
This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus
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