Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Product Information
Published:
10/20/2006
Pages:
23
ISBN:
0733777945
File Size:
1 file , 700 KB
Language:
English
Note:
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