AS ISO 14606-2006
Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
Standards Australia , 10/20/2006
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Adopts ISO 14606:2000 to give guidance on the optimization of sputter depth profiling parameters using appropriate single-layered and multi-layered reference materials in order to achieve optimum depth resolution as a function of instrument settings.
Product Information
Published:
10/20/2006
Pages:
15
ISBN:
0733777953
File Size:
1 file , 690 KB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus
