Adopts IEC 61164 Ed. 2.0 (2004) to describe the power law reliability growth model and related projection model, with step-by-step guidance on their use.
Product Information
Published:
01/01/2008
Pages:
49
ISBN:
0733788408
File Size:
1 file , 1.8 MB
Language:
English
Note:
This product is unavailable in Ukraine, Russia, Belarus