Sets out a wavelength dispersive X-ray fluorescence procedure for the determination of zirconium, hafnium, silicon, aluminium, titanium, iron, phosphorus, calcium, lanthanum, cerium, thorium, uranium, arsenic and lead in zircon materials.
Product Information
Published:
01/01/1997
Pages:
47
ISBN:
0733711626
File Size:
1 file , 240 KB
Language:
English
Note:
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