Sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorous, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel, expressed as the oxides on an as-received basis.
Product Information
Published:
01/05/1997
Pages:
22
File Size:
1 file , 160 KB
Language:
English
Note:
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